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北京 – 2014年10月24日
上海－2014年10月28日
在材料表征方面有30多年经验的美国埃文思分析集团（EAG），现邀请您参加我们于2014年10月24日在北京和10月28日在上海举办的材料分析技术研讨会。与以往不同的是，会议将讨论目前主流的材料的分析方法，并提供分析案例。分享内容将全面覆盖以往分开举办的SIMS与GDMS等相关技术研讨会。
对于想了解相关材料分析技术，以及在材料认证、工艺控制和良率提升方面如何最有效的应用这些技术的您来说，这是一个绝好的机会。
| 会场 A | 会场 B | ||
| 8:45 – 09:15 | 签到注册 | 签到注册 | 8:45 – 09:15 |
| 9:15 – 9:45 | 公司介绍 | 公司介绍 | 9:15 – 9:45 |
| 9:45 – 10:15 | 二次离子质谱(SIMS)-原理 二次离子质谱 |
当代前沿科技对新材料的需求及挑战 | 9:45 – 10:15 |
| 10:15 – 10:45 | 茶歇 | 茶歇 | 10:15 – 10:45 |
| 10:45 – 11:30 | 二次离子质谱(SIMS)-应用 | 辉光放电质谱 GDMS | 10:45 – 11:30 |
| 11:30 – 12:00 | XPS X射线光电子能谱 |
气体分析IGA 热分析技术-热重/热差/差示扫描热量TGA/DTA/DSC |
11:30 – 12:15 |
| 12:00 – 13:30 | 午餐 | 午餐 | 12:15 – 13:45 |
| 13:30 – 14:00 | AES 俄歇电子能谱 |
电感耦合等离子质及光谱 ICP-MS and ICP-OES |
13:45 – 14:15 |
| 14:00 – 14:45 | TEM 透射电子显微镜 |
材料纯度分析：湿法分析（ICP）和固体直接取样分析（GDMS）的优缺点比较 | 14:15 – 14:45 |
| 14:45 – 15:15 | 茶歇 | 茶歇 | 14:45 – 15:15 |
| 15:15 – 15:45 | RBS 卢瑟福背散射 |
实现高性能合金品质可靠性及一致性生产 | 15:15 – 15:45 |
| 15:45 – 16:15 | TOF-SIMS 飞行时间二次离子质谱 |
案例分析 高纯硅 石墨 碳化硅 及 氧化铝 |
15:45 – 16:15 |
| 16:15 – 17:00 | 总结/问答 | 总结/问答 | 16:15 – 17:00 |
关于EAG:
埃文思分析集团（EAG）是材料分析行业的全球领导者，在材料表面及本体结构组成表征分析服务方面有30多年的专业经验。, 我们与半导体、航空航天、通讯、激光/光学、数据存储，生物医疗设备及器件、汽车和新能源等多个行业进行紧密合作，为各行业合作伙伴们涉及研发、生产支持、失效分析、产品质量认证及供应链体系质量控制等各环节提供一流质量的、高效的材料表征分析服务。
EAG在全球共设有11个实验室和服务中心。我们提供29种自有分析技术服务包括SIMS, GDMS, Quad SIMS, TOF-SIMS, ICP-MS/OES, XPS, AES, FTIR, SEM/EDS, FIB, TXRF, AFM/SPM, RBS, HFS, PIXE, XRF, Raman, 和GC/MS 以及符合要求的合作方提供的分析服务。依靠充足的设备资源以及先进的分析技术我们可以提供快速的分析周期、更高的数据质量、完美的检测限，以及一站式全面分析服务。
报告人简介:
Larry Wang
Vice President and Scientific Fellow of SIMS Services at Evans Analytical Group. Dr. Wang is responsible for the operation of SIMS analytical services, and for technical developments on SIMS analysis of new materials and new structures. Dr. Wang joined Charles Evans & Associates, now Evans Analytical Group, in 1994. Dr. Wang has over 20 years experience with a variety of analytical techniques for material analysis.
Karol Putyera
Vice President, GDMS Analytical Services, New York. Dr. Putyera started to work for Shiva Technologies, Inc. in 1992 as a part-time GDMS analyst while being a Research Associate in the L.C. Smith College of Chemical Engineering and Materials Science at Syracuse University NY, from 1992-1995. Dr. Putyera completed his BS and M.S. degrees in Physical Chemistry at Charles University, Prague, Czech Republic in 1983 and 1985, respectively. He received his Ph.D. degree in Inorganic Chemistry in 1991 at the Institute of Inorganic Chemistry, Slovak Academy of Sciences, Slovak Republic.
Patrick Schnabel
Dr. Schnabel is the Director of Quality and Manager of the RBS, Auger and TXRF lab at EAG. He is responsible for the Quality Assurance Program at EAG and for the operation of RBS, Auger and TXRF analytical services. Dr. Schnabel joined EAG in 1997. Prior to working at EAG he was a Laboratory Manager at Degussa Corporation in Germany. Dr. Schnabel has more than 20 years’ experience in surface analysis and materials characterization. He has a Ph.D. in Chemical Engineering from the Technical University Darmstadt, Germany.
Jackey He
Mr. He is the Technical Director of Evans Analytical Group (China), responsible for surface analysis laboratory operations, sales and marketing. He joined Advanced Materials Engineering Research, Inc. (AMER) since 2005, and successfully launched AMER China, Inc. in Shanghai during 2005. Mr. He joined Evans Analytical Group (EAG) with the acquisition of AMER China in Dec., 2006. Prior to his current position he was a Technical Manager with Shanghai Yes Semiconductor Ltd, responsible for failure analysis.
Xinwei Wang
Manager of New Development and Project at Evans Analytical Group - New York. Dr. Wang joined EAG in 2009 in charging of developing thermal analysis services and later helping developing other bulk elemental analysis techniques (ICP-MS/OES, GDMS and IGA). Prior to joining EAG, he worked as a postdoc in energy storage materials, hydrogen fuel cells and batteries. Dr. Wang completed his PhD in Chemistry from State University of New York – Environmental Sciences and Forestry and Syracuse University in 2005.
Andrew Su
Team Leader, Element GD & Astrum Group. Mr. Su joined Shiva Technologies, Inc., EAG-NY’s predecessor company in 2005 as a staff analyst first specializing on inorganic gas analyzers (IGA) later on advanced materials characterization using high resolution glow-discharge mass spectrometry techniques (GDMS). Recently his main focus is on method developments for high resolution GDMS instruments equipped with fast-flow glow-discharge ion source. Mr. Su received M.S. in Chemical Engineering from Syracuse University, Syracuse, NY, USA in 2005 and B.S. from National Taipei University of Technology, Taiwan in 1998.
Fangfang Mao
Dr. Mao is the TEM scientist of Evans Analytical Group (China), responsible for TEM technique at EAG-China. Dr. Mao joined Evans Analytical Group (EAG) in 2013. Prior to his current position she was a TEM researcher as a Ph.D. in Shanghai Institute of Ceramics, CAS.
Nickey Liu
Mr. Liu is the GDMS Manager of Evans Analytical Group (China), responsible for GDMS technique at EAG-China. Mr. Liu joined Evans Analytical Group (EAG) in 2008. Prior to his current position he was an IC design manager with Shanghai Aopen Ltd, responsible for PC motherboard design.
会议注册:
参会需要提前注册. 请点击下面的链接在线注册或联系我们的工作人员:
Ying Zhou: ying.zhou@eag.com
REGISTER 北京研讨会
星期三, 2014年10月24日
清华紫光国际交流中心
北京海淀区中关村东路1号10号楼
电话: 010-62791888
REGISTER 上海研讨会
星期五, 2014年10月28日
上海帝盛酒店
浦东新区花木路800号
电话: 021-35822222
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